Scaling of the Thue-Morse Diffraction Measure
M. Baakea, U. Grimmb and J. Nilssona
aFakultät für Mathematik, Universität Bielefeld, Postfach 100131, 33501 Bielefeld, Germany
bDepartment of Mathematics and Statistics, The Open University, Walton Hall, Milton Keynes MK7 6AA, UK
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We revisit the well-known and much studied Riesz product representation of the Thue-Morse diffraction measure, which is also the maximal spectral measure for the corresponding dynamical spectrum in the complement of the pure point part. The known scaling relations are summarised, and some new findings are explained. (Changes marked in green introduced on March 21, 2016).

DOI: 10.12693/APhysPolA.126.431
PACS numbers: 61.05.cc, 61.43.-j, 61.44.Br