PeakForce Tapping Technique for Characterization of Thin Organic Passivating Layers |
| E. Papis-Polakowskaa, B. Radkowskib, S. Leskoc and J. Kaniewskia
aInstitute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland bLabsoft - Krzysztof Herman, Wantule 12, 02-828 Warszawa, Poland cBruker Nano Surfaces Division, 112 Robin Hill Road, Santa Barbara, CA 93117, USA |
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| The PeakForce Tapping technique was used for study of GaAs and GaSb surfaces treated by hexadecanethiol (HDT) - the sensitive self-assemble compound. The results of both surface morphology control and electrical properties characterization have been presented. |
DOI: 10.12693/APhysPolA.125.1056 PACS numbers: 07.79.Lh, 64.75.Yz, 81.65.Rv |