PeakForce Tapping Technique for Characterization of Thin Organic Passivating Layers
E. Papis-Polakowskaa, B. Radkowskib, S. Leskoc and J. Kaniewskia
aInstitute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland
bLabsoft - Krzysztof Herman, Wantule 12, 02-828 Warszawa, Poland
cBruker Nano Surfaces Division, 112 Robin Hill Road, Santa Barbara, CA 93117, USA
Full Text PDF
The PeakForce Tapping technique was used for study of GaAs and GaSb surfaces treated by hexadecanethiol (HDT) - the sensitive self-assemble compound. The results of both surface morphology control and electrical properties characterization have been presented.

DOI: 10.12693/APhysPolA.125.1056
PACS numbers: 07.79.Lh, 64.75.Yz, 81.65.Rv