A New Generation of Variable Temperature Scanning Probe Microscope for Spectroscopy
P. Chomiuka, B. Uderb, A. Bettacb, J. Köbleb and C. Tröppnerb
aAPVACUUM Ltd., Klonowa 24, 62-002 Suchy Las k. Poznania, Poland
bOxford Instruments Omicron NanoScience, Limburger Str. 75, 65232 Taunusstein, Germany
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In this contribution we present the design and first results of a new generation of variable temperature scanning probe microscope that has been developed to enhance the performance in tunnelling spectroscopy at lower temperatures. Its performance has been proven with imaging and spectroscopy experiments on the well known Si(111), Au(111), and Ag(111) surfaces.

DOI: 10.12693/APhysPolA.125.1049
PACS numbers: 68.37.Ef, 73.20.At