Unstable Inverse Heat Transfer Problems in Microelectronics |

G. De Mey
^{a}, B. Bogusławski^{b} and A. Kos^{b}^{a}University of Ghent, Department of Electronics and Information Systems, Sint Pietersnieuwstraat 41, 9000 Gent, Belgium
^{b}AGH University of Science and Technology, Institute of Electronics, al. A. Mickiewicza 30, 30-059 Kraków, Poland |

Received: August 6, 2012; in final form: January 15, 2013 |

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Inverse heat transfer problems are very important for the thermal testability of integrated circuits. Temperature sensors integrated on the same chip measure in real time the power dissipation in one or more critical heat sources of the circuit in order to prevent overheating. It will be demonstrated that these kinds of problems can give rise to mathematical unstabilities or the ill conditioning of the inverse problem. This statement will be proved with the help of several particular cases. |

DOI: 10.12693/APhysPolA.123.637 PACS numbers: 02.30.Zz, 44.05.+e, 85.40.Qx |