ACTA

THz Time Domain Spectroscopy of Thin Gold Layers on GaAs

J. Szczytko^a, R. Adomavicius^b, E. Papis^c, A. Barańska^c, A. Wawro^d, A. Krotkus^b, B. Piętka^a and J. Łusakowski^a
^aInstitute of Experimental Physics, Faculty of Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland
^bCenter for Physical Sciences and Technology, A. Gostauto 11, 01108, Vilnius, Lithuania
^cInstitute of Electron Technology, al. Lotników 32/46, 02-668 Warsaw, Poland
^dInstitute of Physics, PAS, al. Lotników 32/46, 02-668 Warsaw, Poland

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Thin layers of Au with the thickness of several nanometers were prepared on a semi-insulating GaAs substrate. The layers' thickness was determined by ellipsometry. THz time-domain spectroscopy was applied to determine a complex index of refraction of thin Au layers. The obtained results allow for a more precise modeling of the performance of semiconductor devices at THz frequencies.

DOI: 10.12693/APhysPolA.122.1118
PACS numbers: 78.66.Bz, 78.68.+m