Measuring the Energy Landscape in Single Semiconductor Nanowires
L.M. Smith a, H.E. Jackson a, J. Yarrison-Rice b and Ch. Jagadish c
aDepartment of Physics, University of Cincinnati, Cincinnati, Ohio 45221-0011, United States
bDepartment of Physics, Miami University, Oxford, Ohio 45056, United States
cDepartment of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra, ACT 0200, Australia
Full Text PDF
With the ability to design and control the physical structure of nanostructures to tune their electronic properties, it is increasingly important to measure the electronic structure of single nanostructures. Here we describe a number of experimental techniques for measuring the electronic structure of single semiconductor nanowires. The advantages, disadvantages and limitations of these methods will be described.
DOI: 10.12693/APhysPolA.122.316
PACS numbers: 73.22.-f, 73.43.Fj, 73.50.Gr, 73.50.Pz, 73.63.-b, 78.30.Fs, 78.35.+c, 78.55.-m, 78.67.-n