Superconducting Properties of VN-SiO2 Sol-Gel Derived Thin Films
B. Kościelskaa, O.I. Yuzephovichb,c, S.V. Bengusb,c, A. Winiarskid, W. Sadowskia and M. Łapińskia
aWFaculty of Applied Physics and Mathematics, Gdansk University of Technology, Narutowicza 11/12, 80-233 Gdańsk, Poland
bB. Verkin Institute for Low Temperature Physics and Engineering, NAS of Ukraine, Kharkov 61103, Ukraine
cInternational Laboratory of High Magnetic Fields and Low Temperatures, Gajowicka 95, 53-421 Wrocław, Poland
dA. Chełkowski Institute of Physics, University of Silesia, Uniwersytecka 4, 40-007 Katowice, Poland
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In this work studies of structure and superconducting properties of VN SiO2 films are reported. The films were obtained through thermal nitridation (ammonolysis) of sol-gel derived V2O3-SiO2 coatings (in a proper V2O3/SiO2 ratio) at 1200°C. This process leads to the formation of disordered structure with VN metallic grains dispersed in the insulating SiO2 matrix. The structural transformations occurring in the films as a result of ammonolysis were studied using X-ray photoelectron spectroscopy (XPS). The critical superconducting parameters are obtained. The magnetoresistance at high magnetic fields has been investigated.
DOI: 10.12693/APhysPolA.121.832
PACS numbers: 81.20.Fw, 74.78.-w