The Role of Frustration in Magnetism of Ge1-xCrxTe Semimagnetic Semiconductor
L. Kilanski, M. Górska, W. Dobrowolski, M. Arciszewska, V. Domukhovski
Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
J.R. Anderson, N.P. Butch
Department of Physics & Center for Nanophysics and Advanced Materials, University of Maryland, College Park, MD 20742, USA
A. Podgórni
Faculty of Physics, Warsaw University of Technology, 00-662 Warsaw, Poland
V.E. Slynko and E.I. Slynko
Institute of Material Science Problems, Ukrainian Academy of Sciences, 5 Wilde Str., 274001, Chernovtsy, Ukraine
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We present preliminary studies of magnetic properties of Ge1-xCrxTe semimagnetic semiconductors with low chromium content x < 0.026. The static and dynamic magnetometry techniques were employed for the current investigations. The obtained results showed large bifurcations between zero-field cooled and field cooled magnetization curves at temperatures lower than 50 K. The dynamic susceptibility measurements proved via frequency shifting of the peaks that the observed magnetic order at low temperatures was the spin-glass-like state caused by magnetic frustration of the system.
DOI: 10.12693/APhysPolA.119.654
Erratum DOI: 10.12693/APhysPolA.119.904
PACS numbers: 75.40.Cx, 75.40.Gb, 75.50.Lk, 75.50.Pp