Sensitivity of Polarimetric Waveguide Interferometer for Different Wavelengths
K. Gut, A. Zakrzewski and T. Pustelny
Department of Optoelectronics, Silesian University of Technology, Krzywoustego 2, 44-100 Gliwice, Poland
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This publication presents experimental measurement methodology which allows to determine the characteristics of sensitivity planar differential interferometer. To confirm data reliability additional measurements were done such as simulations in OptiBPM software by Optiwave. Curves received from two methods: experimental and theoretical, were summed up and compared. Conclusions were made on their basis, for example the influence of used wavelengths or refractive index of single mode waveguide cladding on curves of sensitivity differential interferometer using planar waveguide received from the ion exchange method.
DOI: 10.12693/APhysPolA.118.1140
PACS numbers: 42.25.Hz, 42.25.-p, 42.70.-a, 42.82.-m, 42.82.Et, 68.35.Ct