Electronic Transport Properties and Growth Mechanisms of Ni-Fe/Au/Co/Au Multilayers from In Situ Conduction Measurements
M. Błaszyka, M. Kempińskib, K. Buchtaa, P. Chomiuka and T. Lucińskia
aInstitute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
bPhysics Department, A. Mickiewicz University, Umultowska 85, 61-614 Poznań, Poland
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In the following we present the role of surface scattering at Au/Co and Au/Ni-Fe interfaces in Ni-Fe/Au/Co/Au multilayers deposited in different temperatures. Specularity parameter, which describes the electron scattering, is calculated from fitting in situ collected conductance data with the Fuchs-Namba-Tesanovic model. Application of the parallel resistors model enabled to depict changes between Au/Co and Au/Ni-Fe interfaces within multilayers for each repetition. The correlation between enhanced grain boundary scattering for higher deposition temperatures and surface roughness of Ni-Fe/Au/Co/Au multilayers is found.
DOI: 10.12693/APhysPolA.118.861
PACS numbers: 73.50.-h, 73.61.-r, 75.70.Cn, 72.15.-v