Interface Properties of Single and Bi-Layer Fe3O4 Films Grown on MgO(001) Studied by RBS and Channeling Experiments

N.-T.H. Kim-Ngana, A.G. Baloghb, J. Brötzb, M. Zającc, d and J. Koreckic, e aInstitute of Physics, Pedagogical University, Podchorążych 2, 30-084 Kraków, Poland bInstitute of Materials Science, Technische Universität Darmstadt, Petersenstr. 23, 64287 Darmstadt, Germany cFaculty of Physics and Applied Computer Science, University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, Poland dEuropean Synchrotron Radiation Facility, 38043 Grenoble, France eInstitute of Catalysis and Surface Chemistry, Polish Academy of Sciences, 30-239 Kraków, Poland

Received: August 5, 2010

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Series of Fe3O4/MgO(001) and Fe3O4/Fe/MgO(001) films (single- and bi-layer films, respectively) with a total layer thickness in the range of 20 ÷ 150 nm were investigated by the Rutherford backscattering spectrometry (2 MeV He+ ion beam), by the Rutherford backscattering spectrometry channeling experiments (1.5 MeV He+ ion beam). Depending on the layer thickness of each layer and the film geometry, a single Fe peak and/or a double-anomaly feature was revealed in the Rutherford backscattering spectra. For all films no magnesium presence in the surface layer was observed. For both single- and bi-layer films with a total layer thickness less than 60 nm only one minimum was observed in the channeling curves, while a double minimum was revealed for the bi-layer films with a larger thickness. X-ray reflectometry measurements have revealed that the film density is the same as that of the bulk one.

DOI: 10.12693/APhysPolA.118.570 PACS numbers: 34.35.+a, 68.35.Ct, 68.35.Fx, 68.47.Gh