X-ray Topographic Investigations of Domain Structure in Czochralski Grown PrxLa1-xAlO3 Crystals

K. Wieteskaa, W. Wierzchowskib, A. Malinowskab, S. Turczyńskib, M. Lefeld-Sosnowskac, D.A. Pawlakb, T. Łukasiewiczb and W. Graeffd a Institute of Atomic Energy POLATOM, 05-400 Otwock-Świerk, Poland b Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland c Institute of Experimental Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland d HASYLAB at DESY, Notkestr. 85, 22-603 Hamburg, Germany

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In the present paper X-ray diffraction topographic techniques were applied to a number of samples cut from Czochralski grown PrxLa1-xAlO3 crystals with different ratio of praseodymium and lanthanum. Conventional and synchrotron X-ray topographic investigations revealed differently developed domain structures dependent on the composition of mixed praseodymium lanthanum aluminium perovskites. Some large mosaic blocks were observed together with the domains. In the best crystals, X-ray topographs revealed striation fringes and individual dislocations inside large domains. Synchrotron topographs allowed us to indicate that the domains correspond to three different crystallographic planes, and to evaluate the lattice misorientation between domains in the range of 20-50 arc min.

DOI: 10.12693/APhysPolA.117.268 PACS numbers: 81.05.-t, 81.10.Dn, 61.72.Ff