Combined X-Ray Diffraction and Absorption Study οf Crystalline Vanadium-Doped Lithium Disilicate
W. Paszkowicza, A. Wolskaa, M.T. Klepkaa, S. abd el Allb, and F.M. Ezz-Eldinb
a Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warszawa, Poland
b Center of Research and Radiation Technology, Nasr City, Cairo 0002, Egypt
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Structure of vanadium-doped lithium disilicate, Li2Si2O5 (Ccc2 space group) is studied. This crystalline phase is obtained by annealing of the doped lithium disilicate glass for 4 h at 550°C. X-ray diffraction and X-ray absorption near-edge structure analysis indicate location of vanadium atoms at Si sites. the lattice parameters are found to increase isotropically with increasing vanadium content. the valency of vanadium ions is discussed on the basis of X-ray absorption near-edge structure results.
DOI: 10.12693/APhysPolA.117.315
PACS numbers: 61.43.Fs, 61.66.Fn, 71.20.Ps, 81.05.Je