Non-Destructive Characterization, Inspection, Failure Analysis of Advanced Components and Sensors with a High Resolution and High Contrast Micro XCT System |
| S.H. Lau
Xradia, Inc., Concord, CA 94520, USA |
| and A. Kowalczyk
LOT-Oriel, 41-710, Ruda Śląska, Poland |
| Full Text PDF |
| DOI: 10.12693/APhysPolA.116.S-192 |