Non-Destructive Characterization, Inspection, Failure Analysis of Advanced Components and Sensors with a High Resolution and High Contrast Micro XCT System |
S.H. Lau
Xradia, Inc., Concord, CA 94520, USA |
and A. Kowalczyk
LOT-Oriel, 41-710, Ruda Śląska, Poland |
Full Text PDF |
DOI: 10.12693/APhysPolA.116.S-192 |