Full Field Nanoimprint on Mask Aligners Using Substrate Conformal Imprint Lithography Technique
Ran Ji, A. Krüger, M. Hornung
SUSS MicroTec Lithography GmbH, Garching, Germany
M. Verschuuren, R. van de Laar and J. van Eekelen
Philips Research, Eindhoven, Netherlands
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DOI: 10.12693/APhysPolA.116.S-187