Investigation of the Fluorescence Spectra of Cs Vapor Layers with Nanometric Thickness

K. Vasevaa, P. Todorova, S. Cartalevaa, D. Slavova and S. Saltielb a Institute of Electronics, Bulgarian Academy of Sciences, 72 Tzarigradsko Shosse Bld, 1784 Sofia, Bulgaria b Sofia University, Faculty of Physics, 5 J. Bourchier Boulevard, 1164 Sofia, Bulgaria

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The high resolution spectroscopy of nanometric alkali vapor layers has been made possible through the development of extremely thin cell. We present a detailed comparison of the fluorescence profiles amplitude and width, obtained in the extremely thin cell, both theoretically and experimentally. Experiments are performed on the D2 line of Cs vapor layer with thickness L = mλ, where m = 0.5, 0.75, 1, 1.25. The enhancement rate of the transition profiles width is not growing monotonously, but it is larger for L varying in the interval from L = 0.75 λ to L = λ than that varying in the interval from L = λ to L = 1.25 λ. The used theoretical model, based on the optical Bloch equations is in qualitative agreement with the experimental observations.

DOI: 10.12693/APhysPolA.116.573 PACS numbers: 32.30.-r, 32.70.Jz