Properties of Indium Tin Oxide Thin Films Deposited on Polymer Substrates

S.H. Mohamed a, F.M. El-Hossary a, G.A. Gamal b and M.M. Kahlid b a Physics Department, Faculty of Science, Sohag University, 82524 Sohag, Egypt, b Physics Department, Faculty of Science, South Valley University, 83523 Qena, Egypt

Received: September 5, 2008; Revised version: October 21, 2008;

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Indium tin oxide thin films with different thicknesses were deposited on polymer substrates, held at room temperature, using electron beam evaporation. The dependence of structural properties, optical properties and room temperature resistivity on the indium tin oxide film thickness was studied. X-ray diffraction illustrates the amorphous structure for all the indium tin oxide prepared films. The high roughness of the polymer substrate affects the properties of indium tin oxide films. The transmittance, the resistivity, and the optical band gap decrease with increasing the film thickness while the refractive index increases. The present indium tin oxide films are amorphous, transparent and have relatively low resistivity. These properties are suitable as transparent electrode for organic light-emitting diodes, touch screens, and in piezoelectric applications.

DOI: 10.12693/APhysPolA.115.704 PACS numbers: 61.05.cp, 07.79.Lh, 78.66.-w, 73.61.-r