XAFS Studies of the Behaviour of Bi in Co/Cu Multilayers |
| M. Krupiński a,b, M. Marszałek a, Cz. Kapusta b and A. Dobrowolska a
a Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences, Radzikowskiego 152, 31-342 Kraków, Poland b AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, Poland c Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22603 Hamburg, Germany |
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| The atomic environment of Bi atoms in the Co/Cu multilayered system was studied with X-ray absorption fine structure spectroscopy. Experiments were carried out on a Co(1 nm)/Cu(2 nm) system with 5 and 10 repetitions of Co/Cu evaporated with very low deposition rate in ultrahigh vacuum. A very small amount of Bi (0.06 nm) was deposited on each Cu film in the system. The X-ray absorption fine structure spectra were measured at the BiL3 edge in the X-ray absorption near-edge structure and extended X-ray absorption fine structure ranges at the Beamline X1 of HASYLAB/DESY synchrotron laboratory in Hamburg. The experimental data showed different local neighbourhood of Bi, depending on the number of Co/Cu bilayer repetitions. The results are discussed in terms of the location and segregation of the Bi atoms as well as its possible oxidation ways. |
| DOI: 10.12693/APhysPolA.115.565 PACS numbers: 61.05.cj, 68.55.-a, 68.65.Ac |