Depth-Resolved XMCD Study of Ultrathin Mo/Co/Au Films
M. Sakamaki a, H. Abe b,, R. Sumii c, K. Amemiya c,d, T. Konishi a, T. Fujikawa a, L.T. Baczewski e, A. Wawro e, A. Petroutchik e, Z. Kurant e and A. Maziewski f
a Graduate School of Advanced Integration Science, Chiba University, Yayoi-cho 1-33, Inage, Chiba 263-8522, Japan
b Graduate School of Science, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
c Institute of Materials Structure Science, High Energy Accelerator Reseach Organization, 1-1 Oho, Tsukuba-shi, Ibaraki 305-0801, Japan
d Japan Science and Technology Agency, CREST
e Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
f Institute of Experimental Physics, University of Białystok, Lipowa 41, 15-424 Białystok, Poland
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The effect of Mo overlayer on the magnetism of ultrathin Co films grown on Au(111) was studied. The structure and magnetism at the Mo/Co interface were studied by means of depth-resolved X-ray magnetic circular dichroism. The magnetic moment of Co near the Mo/Co interface was reduced in comparison to the inner part of the film for the samples which have in-plane anisotropy. This effect is more prominent in the case of Mo overlayer with higher roughness, and can be attributed to Co-Mo intermixing at the interface.
DOI: 10.12693/APhysPolA.115.309
PACS numbers: 75.30.Gw, 75.70.Cn, 78.70.Dm