Interface Mixing in Fe/Si Multilayers Observed by the In Situ Conductance Measurements |
| P. Chomiuk, M. Błaszyk, B. Szymański and T. Luciński
Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland |
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| In this contribution the in situ conductance vs. deposition time dependences of Fe/Si multilayers are analysed. The plot of resistance multiplied by the square of the thickness as a function of iron thickness shows that during the iron deposition initially amorphous-like Fe-Si mixture is formed, next the mixture crystallises, and finally bcc-Fe phase appears. The interface mixing is also manifested by the reduction of the total multilayer thickness measured by small angle X-ray diffraction. |
| DOI: 10.12693/APhysPolA.115.355 PACS numbers: 73.40.Sx, 73.50.-h |