Determination of the Temperature Dependent Thermal Expansion Coefficients of Bulk AlN by HRXRD
H. Kröncke a, S. Figge a, B.M. Epelbaum b and D. Hommel a
a Institute of Solid State Physics, Section Semiconductor Epitaxy, University of Bremen, Otto-Hahn-Allee 1, D-28359 Bremen, Germany
b Department of Materials Science 6, University of Erlangen-Nürnberg, Martensstrasse 7, D-91058 Erlangen, Germany
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Received: 7 06 2008;
We measured the lattice constants of bulk aluminum nitride crystals at various temperatures by high resolution X-ray diffraction. By the use of a high temperature chamber and a X-ray cryostat a temperature regime from 20 to 1210 K was available. Furthermore, the measured data were fitted by Einstein- and Debye models which yield reliable parameters for the calculation of the thermal expansion coefficients of AlN.
DOI: 10.12693/APhysPolA.114.1193
PACS numbers: 01.30.Cc, 61.05.cp, 81.05.Ea, 65.40.De