X-Ray Topographic Studies of Defect Structure in YVO4 Crystals
K. Wieteska a, W. Wierzchowski b, T. Łukasiewicz b, E. Wierzbicka b,; c, A. Malinowska b,; d, M. Lefeld-Sosnowska c and W. Graeff e
a Institute of Atomic Energy, 05-400 Otwock-Świerk, Poland
b Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland
c Institute of Experimental Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland
d Faculty of Physics, Warsaw University of Technology, Koszykowa 75, 00-662 Warsaw, Poland
e HASYLAB at DESY, Notkestr. 85, 22-603 Hamburg, Germany
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Received: 24 09 2007;
The perfection of YVO4 crystals, which are predicted to replace formerly used YAG garnets due to higher quantum efficiency and lower excitation level, was studied. The investigations of Czochralski grown undoped YVO4 single crystals were performed mainly by means of X-ray topographic methods. Both synchrotron and conventional X-ray sources were used. The study revealed relatively high density of weak point-like contrasts which can be most probably interpreted as dislocation outcrops. In regions of the crystal close to its boundary we observed glide bands. It was also found that in some regions the dislocations form local subgrain boundaries. The white beam back reflection and monochromatic beam topography allowed to evaluate a local misorientation which not exceeded several angular minutes. No segregation fringes were observed proving a good homogeneity of chemical composition.
DOI: 10.12693/APhysPolA.114.455
PACS numbers: 61.72.Ff