Conventional and Synchrotron X-Ray Topography of Defects in the Core Region of SrLaGaO4
A. Malinowska a, b, M. Lefeld-Sosnowska c, K. Wieteska d, W. Wierzchowski b, A. Pajączkowska b and W. Graeff e
a Faculty of Physics, Warsaw University of Technology, Koszykowa 75, PL-00-662 Warsaw, Poland
b Institute of Electronic Materials Technology, Wólczyńska 133, PL-01-919 Warsaw, Poland
c Institute of Experimental Physics, University of Warsaw, Hoża 69, PL-00-681 Warsaw, Poland
d Institute of Atomic Energy, PL-05-400 Otwock-Świerk, Poland
e HASYLAB at DESY, Notkestr. 85, D-22603 Hamburg, Germany
Full Text PDF
Received: 24 09 2007;
SrLaGaO4 single crystals are perspective substrate materials for high temperature superconductors thin films, elements of thermal radiation receivers and other electronic devices. The defect structure of the Czochralski grown SrLaGaO4 crystal was investigated by means of X-ray topography exploring both conventional and synchrotron sources. The crystal lattice defects in the core region of the crystal were investigated. The regular network of defects arranged in rows only in 〈100〉direction was observed. Owing to high resolution of synchrotron radiation white beam back reflection topographs one can distinguish individual spots forming the lines of the rows. It can be supposed that these elongated rod-like volume defects are located in 100 lattice planes forming a kind of walls. They are built approximately of the same phase as crystal but crystallize at a different moment than a rest of the crystal due to the constitutional supercooling.
DOI: 10.12693/APhysPolA.114.433
PACS numbers: 61.72.Ff, 61.72.Nn, 61.72.Lk, 61.72.Qq