Modeling of THz - Electro-Optical Sampling Measurements |
| P. Shiktorov a, E. Starikov a, V. Gružinskis a, L. Varani b and L. Reggiani c
a Semiconductor Physics Institute, Goštauto 11, LT-01108, Vilnius, Lithuania b Institut d''Electronique du Sud (CNRS UMR 5214), UniversitéMontpellier 2, Pl. Eugène Bataillon, 34095 Montpellier Cedex 5, France c Dipartimento di Ingegneria dell'Innovazione, Universitàdel Salento and CNISM, Via Arnesano s/n, I-73100 Lecce, Italy |
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| Received: 26 08 2007; |
| We carry out a theoretical analysis of THz-electro-optical sampling experimental technique applied to semiconductor structures. The difficulties/impossibility of determining the small-signal conductivity spectrum in the framework of such a technique are analyzed and discussed. |
| DOI: 10.12693/APhysPolA.113.913 PACS numbers: 72.20.Ht, 72.30.+q |