Layer and Interface Structure of CoFe/Ru Multilayers |
| A.T.G. Pym a, A. Lamperti a, S. Cardoso b, P.P. Freitas b and B.K. Tanner a
a Department of Physics, Durham University South Road, Durham DH1 3LE UK b INESC-MN, Rua Alves Redol 9, 1000-029 Lisboa, Portugal |
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| Received: 4 07 2007; |
| Grazing incidence X-ray scattering measurements have been performed to probe the structure of CoFe/Ru layers and their interfaces. It was found that the interface width increased approximately linearly with the layer number from the substrate in a multilayer and that a substantial asymmetry existed between the width of CoFe/Ru and Ru/CoFe interfaces. By co-minimizing both the specular and diffuse scatter with that simulated from a model structure, the topological roughness amplitude was determined to be comparable to the intermixing interface width. |
| DOI: 10.12693/APhysPolA.112.1243 PACS numbers: 61.10.Kw, 68.65.Ac, 68.35.Ct, 75.50.Kj, 85.75.Dd, 85.70.Ay |