Mechanical and Electrical Properties, of ZnO-Nanowire/Si-Substrate Junctions Studied by Scanning Probe Microscopy |
| M. Aleszkiewicz, K. Fronc, J. Wróbel, M. Klepka, T. Wojtowicz and G. Karczewski
Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland |
| Full Text PDF |
| Received: 9 06 2007; |
| Scanning tunneling spectroscopy was used to check the tunneling I-V characteristics of junctions formed by n-ZnO nanowires deposited on Si substrates with n- and p-type electrical conductivity (i.e. n-ZnO nanowire/n-Si and n-ZnO nanowire/p-Si junctions, respectively). Simultaneously, several phenomena which influence the measured I-V spectra were studied by atomic force microscopy. These influencing factors are: the deposition density of the nanowires, the possibility of surface modification by tip movement (difference in attraction forces between nanowires and the p-Si and n-Si) and the aging of the surface. |
| DOI: 10.12693/APhysPolA.112.255 PACS numbers: 68.37.Ef, 68.37.Ps, 68.65.La, 73.21.Hb, 78.67.Lt |