Effect of the In-Plane Epitaxial Mismatch between the Substrate and the Film on the Properties of YBa2Cu3O7-δ Films
I.S. Abal'osheva, M.Z. Cieplak, Z. Adamus, M. Berkowski, V. Domukhovski and M. Aleszkiewicz
Instytut Fizyki Polskiej Akademii Nauk, al. Lotników 32/46, 02-668 Warszawa, Poland
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Received: 25 09 2005;
We study the effect of the in-plane epitaxial mismatch between the substrate and the film on the crystallographic structure and the transport properties of YBa2Cu3O7-δ superconducting films of thicknesses ranging between 600 and 3000Å. The films are grown by pulsed laser deposition on the new type of single-crystalline substrates prepared by Czochralski method, with the chemical formula (SrAl0.5Ta0.5O3)0.7(CaAl0.5Ta0.5O3)0 .1(LaAlO3)0.2. We find that superconducting properties of the samples are excellent, and generally they improve with increasing of the film thickness as a result of improved structural ordering. We also investigate the influence of the film thickness on the behavior of the critical current densities.
DOI: 10.12693/APhysPolA.109.549
PACS numbers: 68.55.Jk, 74.25.Sv, 81.15.Aa