ACTA

Structural Studies of Titanium Oxide Multilayers

G.P. Karwasz^a, A. Miotello^a, E. Zomer^a, R.S. Brusa^a, B. Kościelska ^b, C. Armellini^c and A. Kuzmin^d
^aDipartimento di Fisica, Università di Trento, 38050 Povo (TN), Italy
^bInstytut Fizyki, Politechnika Gdańska, 81-862 Gdańsk, Poland
^cIstituto di Fotonica e Nanotccnologie, CNR, 38050 (TN), Italy
^dInstitute of Solid State Physics, University of Latvia, 1063 Riga, Latvia

Full Text PDF

Received: 26 01 2005;

Multilayers of titanium oxide on conductive glasses (silica, covered with indium/tin and tin oxides) were obtained by different methods (from suspension, by sol-gel, by vacuum sputtering). X-ray diffraction and positron annihilation depth-resolved characterization of these samples are presented. The data allow us to determine optimal deposition parameters, in order to obtain the anatase phase, important in practical applications in photoelectrochemical cells.

DOI: 10.12693/APhysPolA.107.977
PACS numbers:82.47.Jk, 78.70.Bj, 61.10.Nz