Scanning Tunnelling Spectroscopy of Periodic Nickel Nanoparticles
M. Kamiński a , B. Susła a , M. Giersig a,b and M. Kandulski a
a Institute of Physics, Poznań University of Technology, Nieszawska 13A, 60-965 Poznań, Poland
b ``CAESAR'' Dept. Nanoparticle Technology Ludwig-Erhard-Allee 2, 53175 Bonn, Germany
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Scanning tunneling microscopy/spectroscopy as well as atomic force microscopy were applied to study the non-structural and nanoelectronic properties of periodic nickel nanoparticles deposited on n-silicon substrates. Periodic nickel (Ni) nanoparticles were prepared by using nanosphere lithography and analyzed by scanning tunneling microscopy/spectroscopy and atomic force microscopy. By the evaporation of Ni perfectly ordered nanoparticles were produced and very good correlation between latex mask was observed. Finally, tunneling spectroscopy performed with non-magnetic tip yield information about local electronic properties of nanoscale structures at surface.
DOI: 10.12693/APhysPolA.104.351
PACS numbers: 68.37.Ef, 61.48.+w