Nanostructure of Thin Gold Films Investigated by Means of Atomic Force Microscopy and X-ray Reflectometry Methods |
| D. Żymierskaa, J. Auleytnera, J. Domagałaa, T. Kobielab and R. Du¶b aInstitute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland bInstitute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52, 01-224 Warsaw, Poland |
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| A study of the thin gold film growth, during the deposition on glass substrate under UHV conditions at low temperatures, is presented. The complementary methods, the atomic force microscopy and grazing incidence X-ray reflectometry, are used for the research. It is shown that due to variation of the time of deposition from 2 to 50 min different kinds of thin Au films nanostructures are obtained: from discontinuous films consisting of isolated islands, via formation of the chains of islands, up to continuous films. |
| DOI: 10.12693/APhysPolA.102.289 PACS numbers: 68.55.--a, 68.37.Ps, 61.10.Kw |