Application of Third Generation Synchrotron Source to Studies of Non-Crystalline Materials: In-Se Amorphous Films |
| A. Buriana,b, A. Jabłońskaa, A.M. Burianb, D. LeBolloc'hc, H. Metzgerc, O. Prouxc,d, J.L. Hazemannc,d, A. Mossetd and D. Raouxe aA. Chełkowski Institute of Physics, University of Silesia, Uniwersytecka 4, 40-007 Katowice, Poland bCentre of Polymer Chemistry, Polish Academy of Sciences, M. Skłodowskiej-Curie 34, 41-819 Zabrze, Poland cESRF, BP 220, 38043 Grenoble, France dLaboratoire de Crystallographie, UPR CNRS 5031 BP 166X, 38042 Grenoble, France eCentre Universitaire Paris-Sud, Batiment 209H BP 34, 91898 Orsay Cedex, France |
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| The local structure of vacuum evaporated In-Se amorphous films, containing 50, 60, and 66 at. % Se, was studied using differential anomalous X-ray scattering and extended X-ray absorption fine structure. Both intensity and absorption spectra were measured in the vicinity of the absorption K-edge of Se. The differential anomalous X-ray scattering data were converted to real space by the inverse Fourier transform yielding the differential radial distribution functions. The obtained results provide evidence for the presence of Se-In spatial correlations for In50Se50 and Se-In and Se-Se correlations for In40Se60 and In34Se66 within the first coordination sphere. |
| DOI: 10.12693/APhysPolA.101.701 PACS numbers: 61.10.-i, 61.43.Dq |