Application of Third Generation Synchrotron Source to Studies of Non-Crystalline Materials: In-Se Amorphous Films
A. Buriana,b, A. Jabłońskaa, A.M. Burianb, D. LeBolloc'hc, H. Metzgerc, O. Prouxc,d, J.L. Hazemannc,d, A. Mossetd and D. Raouxe
aA. Chełkowski Institute of Physics, University of Silesia, Uniwersytecka 4, 40-007 Katowice, Poland
bCentre of Polymer Chemistry, Polish Academy of Sciences, M. Skłodowskiej-Curie 34, 41-819 Zabrze, Poland
cESRF, BP 220, 38043 Grenoble, France
dLaboratoire de Crystallographie, UPR CNRS 5031 BP 166X, 38042 Grenoble, France
eCentre Universitaire Paris-Sud, Batiment 209H BP 34, 91898 Orsay Cedex, France
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The local structure of vacuum evaporated In-Se amorphous films, containing 50, 60, and 66 at. % Se, was studied using differential anomalous X-ray scattering and extended X-ray absorption fine structure. Both intensity and absorption spectra were measured in the vicinity of the absorption K-edge of Se. The differential anomalous X-ray scattering data were converted to real space by the inverse Fourier transform yielding the differential radial distribution functions. The obtained results provide evidence for the presence of Se-In spatial correlations for In50Se50 and Se-In and Se-Se correlations for In40Se60 and In34Se66 within the first coordination sphere.
DOI: 10.12693/APhysPolA.101.701
PACS numbers: 61.10.-i, 61.43.Dq